GarcÃa-Blanco, S. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.
Chicago Style (17th ed.) CitationGarcÃa-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.
MLA (9th ed.) CitationGarcÃa-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.
Advarsel: Disse citationer er muligvist ikke 100% nøjagtige.