Cita APA

García-Blanco, S. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.

Citación estilo Chicago

García-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.

Cita MLA

García-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.