Tohutoro APA (7th ed.)

García-Blanco, S. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.

Tohutoru Kātū Chicago (17th ed.)

García-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.

Tohutoro MLA (9th ed.)

García-Blanco, Sonia. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI. SPIE Digital Library.

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