Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI

Manylion Llyfryddiaeth
Awduron Eraill: García-Blanco, Sonia
Fformat: Electronig eLyfr
Iaith:Saesneg
Cyhoeddwyd: SPIE Digital Library, 3/16/12
Pynciau:
Mynediad Ar-lein:Full text available on Research4Life (SPIE Digital Library)
Disgrifiad
Disgrifiad o'r Eitem:<strong>On-Campus Access Only (IP based access)</strong>
Disgrifiad Corfforoll:1 online resource
Fformat:Mode of access: Internet
ISBN:9780819488930
Mynediad:Electronic access restricted to authorized AUW faculty, staff and students