Starikov, A. Metrology, Inspection, and Process Control for Microlithography XXVI. SPIE Digital Library.
Citación estilo ChicagoStarikov, Alexander. Metrology, Inspection, and Process Control for Microlithography XXVI. SPIE Digital Library.
Cita MLAStarikov, Alexander. Metrology, Inspection, and Process Control for Microlithography XXVI. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.