Citace podle APA (7th ed.)

Stover, J. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.

Citace podle Chicago (17th ed.)

Stover, John. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.

Citace podle MLA (9th ed.)

Stover, John. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.

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