Stover, J. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.
Cita Chicago (17th ed.)Stover, John. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.
Cita MLA (9th ed.)Stover, John. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.
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