Stover, J. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.
Chicago-viite (17. p.)Stover, John. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.
MLA-viite (9. p.)Stover, John. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.
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