Stover, J. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.
Style de citation Chicago (17e éd.)Stover, John. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.
Style de citation MLA (9e éd.)Stover, John. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.
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