APA (7e ed.) Bronvermelding

Stover, J. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.

Chicago (17e ed.) Bronvermelding

Stover, John. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.

MLA (9e ed.) Bronvermelding

Stover, John. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.

Let op: Deze citaties zijn niet altijd 100% accuraat.