APA citiranje

Stover, J. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Stover, John. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.

MLA citiranje

Stover, John. Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays. SPIE Digital Library.

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