Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
| अन्य लेखक: | |
|---|---|
| स्वरूप: | इलेक्ट्रोनिक ई-पुस्तक |
| भाषा: | अंग्रेज़ी |
| प्रकाशित: |
SPIE Digital Library,
11/4/96
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| विषय: | |
| ऑनलाइन पहुंच: | Full text available on Research4Life (SPIE Digital Library) |
| वस्तु वर्णन: | <strong>On-Campus Access Only (IP based access)</strong> |
|---|---|
| भौतिक वर्णन: | 1 online resource |
| स्वरूप: | Mode of access: Internet |
| आईएसबीएन: | 9780819422507 |
| अभिगमन: | Electronic access restricted to authorized AUW faculty, staff and students |