Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
| Ētahi atu kaituhi: | |
|---|---|
| Hōputu: | Tāhiko īPukapuka |
| Reo: | Ingarihi |
| I whakaputaina: |
SPIE Digital Library,
11/4/96
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| Ngā marau: | |
| Urunga tuihono: | Full text available on Research4Life (SPIE Digital Library) |
| Whakaahutanga tūemi: | <strong>On-Campus Access Only (IP based access)</strong> |
|---|---|
| Whakaahuatanga ōkiko: | 1 online resource |
| Hōputu: | Mode of access: Internet |
| ISBN: | 9780819422507 |
| Urunga: | Electronic access restricted to authorized AUW faculty, staff and students |