Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
| Eará dahkkit: | |
|---|---|
| Materiálatiipa: | Elektrovnnalaš E-girji |
| Giella: | eaŋgalasgiella |
| Almmustuhtton: |
SPIE Digital Library,
11/4/96
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| Fáttát: | |
| Liŋkkat: | Full text available on Research4Life (SPIE Digital Library) |
| Fuomášahttimat: | <strong>On-Campus Access Only (IP based access)</strong> |
|---|---|
| Olgguldas hápmi: | 1 online resource |
| Materiálatiipa: | Mode of access: Internet |
| ISBN: | 9780819422507 |
| Beassan: | Electronic access restricted to authorized AUW faculty, staff and students |