Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
| Övriga skapare: | |
|---|---|
| Materialtyp: | Elektronisk E-bok |
| Språk: | engelska |
| Publicerad: |
SPIE Digital Library,
11/4/96
|
| Ämnen: | |
| Länkar: | Full text available on Research4Life (SPIE Digital Library) |
| Beskrivning: | <strong>On-Campus Access Only (IP based access)</strong> |
|---|---|
| Fysisk beskrivning: | 1 online resource |
| Materialtyp: | Mode of access: Internet |
| ISBN: | 9780819422507 |
| Tillgång: | Electronic access restricted to authorized AUW faculty, staff and students |