Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays

Bibliográfalaš dieđut
Eará dahkkit: Stover, John
Materiálatiipa: Elektrovnnalaš E-girji
Giella:eaŋgalasgiella
Almmustuhtton: SPIE Digital Library, 11/4/96
Fáttát:
Liŋkkat:Full text available on Research4Life (SPIE Digital Library)

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