DeBusk, D. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III. SPIE Digital Library.
Chicago Style (17th ed.) CitationDeBusk, Damon. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III. SPIE Digital Library.
MLA (9th ed.) CitationDeBusk, Damon. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.