Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III

Détails bibliographiques
Autres auteurs: DeBusk, Damon
Format: Électronique eBook
Langue:anglais
Publié: SPIE Digital Library, 9/13/96
Sujets:
Accès en ligne:Full text available on Research4Life (SPIE Digital Library)
Description
Description:<strong>On-Campus Access Only (IP based access)</strong>
Description matérielle:1 online resource
Format:Mode of access: Internet
ISBN:9780819422750
Accès:Electronic access restricted to authorized AUW faculty, staff and students