Cita APA

Jones, S. Metrology, Inspection, and Process Control for Microlithography XI. SPIE Digital Library.

Citación estilo Chicago

Jones, Susan. Metrology, Inspection, and Process Control for Microlithography XI. SPIE Digital Library.

Cita MLA

Jones, Susan. Metrology, Inspection, and Process Control for Microlithography XI. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.