APA ציטוט

Jones, S. Metrology, Inspection, and Process Control for Microlithography XI. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Jones, Susan. Metrology, Inspection, and Process Control for Microlithography XI. SPIE Digital Library.

ציטוט MLA

Jones, Susan. Metrology, Inspection, and Process Control for Microlithography XI. SPIE Digital Library.

אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.