APA (7e ed.) Bronvermelding

Keshavarzi, A. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III. SPIE Digital Library.

Chicago (17e ed.) Bronvermelding

Keshavarzi, Ali. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III. SPIE Digital Library.

MLA (9e ed.) Bronvermelding

Keshavarzi, Ali. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III. SPIE Digital Library.

Let op: Deze citaties zijn niet altijd 100% accuraat.