Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III
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| 格式: | 電子 電子書 |
| 語言: | 英语 |
| 出版: |
SPIE Digital Library,
9/11/97
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| 主題: | |
| 在線閱讀: | Full text available on Research4Life (SPIE Digital Library) |
| Item Description: | <strong>On-Campus Access Only (IP based access)</strong> |
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| 實物描述: | 1 online resource |
| 格式: | Mode of access: Internet |
| ISBN: | 9780819426482 |
| 訪問: | Electronic access restricted to authorized AUW faculty, staff and students |