APA (7th ed.) Citation

Stover, J. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Stover, John. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.

MLA (9th ed.) Citation

Stover, John. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.

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