Stover, J. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.
Style de citation Chicago (17e éd.)Stover, John. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.
Style de citation MLA (9e éd.)Stover, John. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.
Attention : ces citations peuvent ne pas être correctes à 100%.