Stover, J. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.
Citazione stile Chigago Style (17a edizione)Stover, John. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.
Citatione MLA (9a ed.)Stover, John. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.