Stover, J. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.
Tohutoru Kātū Chicago (17th ed.)Stover, John. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.
Tohutoro MLA (9th ed.)Stover, John. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.
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