Singh, B. Metrology, Inspection, and Process Control for Microlithography XII. SPIE Digital Library.
Chicago (17e ed.) BronvermeldingSingh, Bhanwar. Metrology, Inspection, and Process Control for Microlithography XII. SPIE Digital Library.
MLA (9e ed.) BronvermeldingSingh, Bhanwar. Metrology, Inspection, and Process Control for Microlithography XII. SPIE Digital Library.
Let op: Deze citaties zijn niet altijd 100% accuraat.