APA引文

Singh, B. Metrology, Inspection, and Process Control for Microlithography XII. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Singh, Bhanwar. Metrology, Inspection, and Process Control for Microlithography XII. SPIE Digital Library.

MLA引文

Singh, Bhanwar. Metrology, Inspection, and Process Control for Microlithography XII. SPIE Digital Library.

警告：這些引文格式不一定是100％准確.