APA ציטוט

Ajuria, S. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Ajuria, Sergio. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.

ציטוט MLA

Ajuria, Sergio. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.