Ajuria, S. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.
Chicago-Zitierstil (17. Ausg.)Ajuria, Sergio. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.
MLA-Zitierstil (9. Ausg.)Ajuria, Sergio. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.