Ajuria, S. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.
Chicago-referens (17:e uppl.)Ajuria, Sergio. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.
MLA-referens (9:e uppl.)Ajuria, Sergio. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.
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