Cita APA (7a ed.)

Amberiadis, K. In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing. SPIE Digital Library.

Cita Chicago Style (17a ed.)

Amberiadis, Kostas. In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing. SPIE Digital Library.

Cita MLA (9a ed.)

Amberiadis, Kostas. In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing. SPIE Digital Library.

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