Amberiadis, K. In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing. SPIE Digital Library.
Tohutoru Kātū Chicago (17th ed.)Amberiadis, Kostas. In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing. SPIE Digital Library.
Tohutoro MLA (9th ed.)Amberiadis, Kostas. In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing. SPIE Digital Library.
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