APA citiranje

Amberiadis, K. In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Amberiadis, Kostas. In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing. SPIE Digital Library.

MLA citiranje

Amberiadis, Kostas. In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing. SPIE Digital Library.

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