Podio, F. Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks. SPIE Digital Library.
Citación estilo ChicagoPodio, Fernando. Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks. SPIE Digital Library.
Cita MLAPodio, Fernando. Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks. SPIE Digital Library.
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