Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks
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| Formaat: | Elektronisch E-boek |
| Taal: | Engels |
| Gepubliceerd in: |
SPIE Digital Library,
11/30/99
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| Onderwerpen: | |
| Online toegang: | Full text available on Research4Life (SPIE Digital Library) |