APA-viite (7. p.)

Ajuria, S. In-Line Methods and Monitors for Process and Yield Improvement. SPIE Digital Library.

Chicago-viite (17. p.)

Ajuria, Sergio. In-Line Methods and Monitors for Process and Yield Improvement. SPIE Digital Library.

MLA-viite (9. p.)

Ajuria, Sergio. In-Line Methods and Monitors for Process and Yield Improvement. SPIE Digital Library.

Varoitus: Nämä viitteet eivät aina ole täysin luotettavia.