APA引文

Sullivan, N. Metrology, Inspection, and Process Control for Microlithography XIV. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Sullivan, Neal. Metrology, Inspection, and Process Control for Microlithography XIV. SPIE Digital Library.

MLA引文

Sullivan, Neal. Metrology, Inspection, and Process Control for Microlithography XIV. SPIE Digital Library.

警告：這些引文格式不一定是100％准確.