Lawton, R. MEMS Reliability for Critical Applications. SPIE Digital Library.
Cita Chicago (17th ed.)Lawton, Russell. MEMS Reliability for Critical Applications. SPIE Digital Library.
Cita MLA (9th ed.)Lawton, Russell. MEMS Reliability for Critical Applications. SPIE Digital Library.
Atenció: Aquestes cites poden no estar 100% correctes.