Microlithographic Techniques in Integrated Circuit Fabrication II

Integrated Circuit Metrology II

Optoelectronic Integrated Circuits II

Advanced Techniques for Integrated Circuit Processing

Integrated Optical Circuit Engineering II

Silicon Photonics and Photonic Integrated Circuits II

Optoelectronic Integrated Circuits

Integrated Optical Circuits

Integrated Optics and Photonic Integrated Circuits

Integrated Circuit Metrology, Inspection, and Process Control II

Lithographic and Micromachining Techniques for Optical Component Fabrication II

Microarrays and Combinatorial Techniques: Design, Fabrication, and Analysis II

Digital integrated circuits : design perspective /
Tekijä: Rabaey, Jan M.

Digital integrated circuits : design perspective /
Tekijä: Rabaey, Jan M.

Digital integrated circuits : design perspective /
Tekijä: Rabaey, Jan M.

Digital integrated circuits : design perspective /
Tekijä: Rabaey, Jan M.

Design, Simulation, and Fabrication of Optoelectronic Devices and Circuits

Integrated Circuit Metrology I

Optoelectronic Integrated Circuits XIII

Optoelectronic Integrated Circuits XIV

Optoelectronic Integrated Circuits IV

Optoelectronic Integrated Circuits VI

Optoelectronic Integrated Circuits IX

Optoelectronic Integrated Circuits X

Optoelectronic Integrated Circuits XII

Functional Photonic Integrated Circuits

Optoelectronic Integrated Circuits XV

Optoelectronic Integrated Circuits VII

Optoelectronic Integrated Circuits VIII

Optoelectronic Integrated Circuits XI

Integrated Optics and Millimeter and Microwave Integrated Circuits

Process, Equipment, and Materials Control in Integrated Circuit Manufacturing II

Nanomaterials Synthesis, Interfacing, and Integrating in Devices, Circuits, and Systems II

Integrated Optics, Silicon Photonics, and Photonic Integrated Circuits

Nanostructure Integration Techniques for Manufacturable Devices, Circuits, and Systems: Interfaces, Interconnects, and Nanosystems

Integrated Optical Circuit Engineering I

Micron and Submicron Integrated Circuit Metrology