Cita APA

Tan, C. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.

Citación estilo Chicago

Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.

Cita MLA

Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.