APA (7th ed.) Citation

Tan, C. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.

MLA (9th ed.) Citation

Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.

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