Tan, C. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
Cita Chicago Style (17a ed.)Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
Cita MLA (9a ed.)Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
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