Tan, C. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
Chicago Style (17th ed.) ZitazioaTan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
MLA (9th ed.) ZitazioaTan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
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