Style de citation APA (7e éd.)

Tan, C. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.

Style de citation Chicago (17e éd.)

Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.

Style de citation MLA (9e éd.)

Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.

Attention : ces citations peuvent ne pas être correctes à 100%.