Tan, C. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
Citazione stile Chigago Style (17a edizione)Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
Citatione MLA (9a ed.)Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.