Tan, C. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
Chicagoスタイル(17版)引用形式Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
MLA(9版)引用形式Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
警告: この引用は必ずしも正確ではありません.