Tan, C. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
Tohutoru Kātū Chicago (17th ed.)Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
Tohutoro MLA (9th ed.)Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
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