Tan, C. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
Chicago-čujuhus (17. p.)Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
MLA-čujuhus (9. p.)Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.
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