APA (7. basım) Alıntı

Tan, C. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.

Chicago Style (17. basım) Atıf

Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.

MLA (9th ed.) Atıf

Tan, Cherming. Microelectronic Yield, Reliability, and Advanced Packaging. SPIE Digital Library.

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